Development of Optical Engineering. Atom Guidance with Optical Near Field.

Optical impedance matching with scanning near-field optical microscopy (SNOM)

An overview of scanning near-field optical microscopy in characterization of nano-materials

Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...

Near-field focusing with optical phase antennas.

We investigate the near-field focusing properties of three-dimensional phase antennas consisting of concentric rings designed to have source and image spots separated by several microns from the lens. Tight focal spots are obtained for silicon or gold rings patterned in a silica matrix. We analyze in detail the dependence of the performance of these lenses on geometrical parameters such as the ...

An overview of scanning near-field optical microscopy in characterization of nano-materials

Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...

Apertureless near-field optical microscope

We demonstrate a new method whereby near-field optical microscope resolution can be extended to the nanometer regime. The technique is based on measuring the modulation of the scattered electric field from the end of a sharp silicon tip as it is stabilized and scanned in close proximity to a sample surface. Our initial results demonstrate resolution in the 3 nm range--comparable to what can be ...